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janwas
9542ecdd7e
refs #117 stub_impl_hack: defines a function otherwise provided by main.cpp remove old self_test.h contents (e.g. TEST); superceded by cxxtestgen TS_ASSERT etc. only include self_test from a test (otherwise, cxxtest include dir won't be set) cxxtest won't run tests named only "test"; add more descriptive name FIXES uncovered by self tests lib: infinite loop in log2 lockfree: incorrect params This was SVN commit r3979.
30 lines
739 B
C++
30 lines
739 B
C++
#include "lib/self_test.h"
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#include "lib/lib.h"
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#include "lib/sysdep/ia32.h"
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// note: ia32_i??_from_*, ia32_rint*, ia32_fm??f are all tested within
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// sysdep to avoid test duplication (both the ia32 versions and
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// the portable fallback must behave the same).
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class TestIA32: public CxxTest::TestSuite
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{
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public:
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void test_rdtsc()
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{
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// must increase monotonously
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const u64 c1 = ia32_rdtsc();
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const u64 c2 = ia32_rdtsc();
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const u64 c3 = ia32_rdtsc();
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TS_ASSERT(c1 < c2 && c2 < c3);
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}
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void test_ia32_cap()
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{
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// make sure the really common/basic caps end up reported as true
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TS_ASSERT(ia32_cap(IA32_CAP_FPU));
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TS_ASSERT(ia32_cap(IA32_CAP_TSC));
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TS_ASSERT(ia32_cap(IA32_CAP_MMX));
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}
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};
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