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28b243d6d50a1b9fbeac787f03cbf76d458b0d6f
0ad/source/lib/tests
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janwas e62deac770 get rid of some instances of type punning (dangerous in the face of aliasing optimizations)
This was SVN commit r6140.
2008-06-28 17:51:18 +00:00
..
test_adts.h
had to remove uint and ulong from lib/types.h due to conflict with other library.
2008-05-11 18:48:32 +00:00
test_base32.h
fix self-tests.
2007-05-10 21:33:56 +00:00
test_bits.h
fixes
2008-06-26 20:12:42 +00:00
test_byte_order.h
get rid of some instances of type punning (dangerous in the face of aliasing optimizations)
2008-06-28 17:51:18 +00:00
test_cache_adt.h
had to remove uint and ulong from lib/types.h due to conflict with other library.
2008-05-11 18:48:32 +00:00
test_fnv_hash.h
fix self-tests.
2007-05-10 21:33:56 +00:00
test_lib.h
# SwEng/cleanup
2007-05-18 00:14:26 +00:00
test_lockfree.h
add NUMA and shared-L2-cache detect code (required at work)
2008-05-12 18:15:08 +00:00
test_path_util.h
improvements and fixes:
2008-01-07 20:03:19 +00:00
test_rand.h
add NUMA and shared-L2-cache detect code (required at work)
2008-05-12 18:15:08 +00:00
test_regex.h
fix self-tests.
2007-05-10 21:33:56 +00:00
test_secure_crt.h
improvements and fixes:
2008-01-07 20:03:19 +00:00
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